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TI系列Bq7037_v0p84 电池充电ic ，指导我们烧录读写程序
4.15Test Module (See Security Document)
4.15.1 Functional Desc
ription
4.15.1.1 Test Mode Entry Sequence
At power up, during FLASH INIT state, if the VNTC1 AND SDA pins are held high AND SCL held low, then the
bg7037 will transition to the TEST_INIT state in which
All the device registers are cleared
SRAM contents are cleared
Scan chains are cleared
